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One-shot devices, which are engineered for one-time use and are often subject to destructive testing, represent an important class of critical components in areas ranging from aerospace to biomedical ...
This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...
IoT requires a new generation of devices that have more capabilities and support multiple technologies. As device complexity grows, so is the importance of testing. Learn how to overcome IoT device ...
http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...